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Measuring the Lifetime of Ultrashort Electronic Coherences with Long Light Pulses: The Fragile Eg State in Sb and Bi

TitleMeasuring the Lifetime of Ultrashort Electronic Coherences with Long Light Pulses: The Fragile Eg State in Sb and Bi
Publication TypeConference Paper
Year of Publication2011
AuthorsLi J, Chen J, Reis DA, Fahy S, Merlin R
Conference NameQuantum Electronics and Laser Science Conference
PublisherOptical Society of America