Measuring and detecting electronic textures in strongly correlated electron systems

Strongly correlated electron systems display a wide range of potentially useful properties. In these systems the correlation of electrons results in very rich phase diagrams with different and interesting ground states. As a consequence of the competition between different phases, very interesting properties like superconductivity and colossal magnetoresistance can occur. This competition between phases leads to electronic domains and inhomogeneities over a range of real-space length scales, from nanometers to hundreds of microns.

Understanding the role that these domains play in defining the properties of strongly correlated electron systems appears as a mandatory requirement in order to achieve a full understanding of these systems.During this talk experiments using soft x-ray resonant scattering will be presented measuring and comparing the charge correlations in cuprate superconductors along with new data obtained by combining nanometer scanning probe microscopy and soft x-ray scattering in order to measure the underlying electronic textures of these materials.

A new beamline dedicated to these type of studies will be presented currently under construction at the NSLS-II, Brookhaven National Laboratory.